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Electron Optics Facility
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  • Hitachi S-4700 FE-SEM
  • FE-SEM Microanalysis
Open
  • Instrumentation
    • FEI 200kV Titan Themis STEM
    • Hitachi FB-2000A FIB
    • Hitachi S-4700 FE-SEM
      • Introduction
      • Basic Science
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      • Software
      • Safety Procedures
      • Operating Procedure
      • Imaging Techniques
      • Microanalysis
      • FAQs
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    • Philips XL 40 ESEM
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FE-SEM Microanalysis

Hitachi S-4700 FE-SEM Training Index

  1. Introduction
  2. Basic Science
    1. Form and Function 1
    2. Form and Function 2
    3. Chemical Analysis
  3. External Components
    1. System
    2. Column
    3. Stage Front
    4. Stage Right
    5. Front Panel
    6. Control Board
  4. Internal Components
  5. Software
  6. Safety Procedures
  1. Operating Procedure
    1. Preliminary
    2. Specimen Exchange
    3. Flashing
    4. Imaging
    5. Shutdown
  2. Imaging Techniques
    1. Backscatter Imaging
    2. Charging
    3. Specimen Types
  3. Microanalysis
    1. X-Ray Spectral Analysis
    2. X-Ray Mapping
  4. FAQs
    1. Specimen Constraints
    2. General FAQs
  5. Troubleshooting

  • X-Ray Spectral Analysis
  • X-Ray Mapping

Microanalysis: X-Ray Spectral Analysis

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