| Allied High Tech Products MultiPrep Polishing System |
Electron Optics |
M&M 637 |
| Anatech Hummer 6 for Etching |
Electron Optics |
M&M 637 |
| Asylum Research MFP-3D Origin+ AFM |
Electron Optics |
M&M 632 |
| Cantilever Tips |
Scanning Probe Microscopy |
|
| Cell Culture Lab |
Confocal Imaging |
Chem Sci S012 |
| Confocal Microscope |
Confocal Imaging |
Chem Sci S012 |
| Cressington 208HR Sputter Coater |
Electron Optics |
M&M 637 |
| Denton DV-502A Carbon Evaporator |
Electron Optics |
M&M 637 |
| FEI 200kV Titan Themis STEM |
Electron Optics |
ATDC Building, West End |
| Hitachi FB-2000A FIB |
Electron Optics |
M&M 632 |
| Hitachi S-4700 FE-SEM |
Electron Optics |
M&M 636 |
| JEOL IB-19500CP Ion Mill |
Electron Optics |
M&M 637 |
| Leica CPD 030 Critical Point Dryer |
Electron Optics |
M&M 637 |
| Leica FCS UCT Cryo Ultramicrotome Attachment |
Electron Optics |
|
| Leica Ultracut UCT Ultramicrotome |
Electron Optics |
M&M 637 |
| Liquid Nitrogen |
Electron Optics |
|
| Perkin Elmer PHI-660 Scanning Auger Microscope |
Surface Analysis |
M&M 615 |
| PHI 5800 X-ray Photoelectron Spectrometer |
Surface Analysis |
M&M 633 |
| Philips Electronic Instruments X-ray Generator |
X-Ray |
M&M U105 |
| Philips XL 40 ESEM |
Electron Optics |
M&M 717 |
| Scintag X2 Powder Diffractometer (coming soon)
|
X-Ray |
|
| Scintag XDS2000 Powder Diffractometer |
X-Ray |
M&M 629 |
| Scintag XDS-2000 PTS |
X-Ray |
M&M 629 |
| Siemens D500 Powder Diffractometer |
X-Ray |
M&M U104 |
| SouthBay Technology Model 650 Low Speed Saw |
Electron Optics |
M&M 637 |
| SouthBay Technology Model 850 Abrasive Slurry Saw |
Electron Optics |
M&M 637 |
| SouthBay Technology MS501B Twinl Jet Electropolisher |
Electron Optics |
M&M 637 |
| Specimen Preparation |
Electron Optics |
M&M 637 |
| Supplies |
Electron Optics |
|
| Veeco Dimension 3000 AFM |
Scanning Probe Microscopy |
M&M 616 |
| Veeco Nanoscope II AFM |
Scanning Probe Microscopy |
M&M 616 |
| Xenemetrix EX-6600 EDS |
X-Ray |
M&M 612D |
