The PHI 5800 XPS probes sample surfaces.

PHI 5800 X-ray Photoelectron Spectrometer


The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including elemental mapping capabilities, an electron gun source for AES analysis, an ion sputter gun for depth profiling, and stage tilting for angle-resolved XPS.

The XPS was generously donated by the Army Research Laboratories with help from the Department of Chemistry at Michigan Tech.

A view of the XPS set up.

A research micrograph from the XPS.



Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

Some of these courses offer advanced study of surfaces.