The Electron Optics Facility (EOF) includes three scanning electron microscopes (SEM), an aberration-corrected atomic resolution scanning transmission electron microscope (STEM), and a focused ion beam (FIB) milling system.
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The Electron Optics Facility (EOF) includes three scanning electron microscopes (SEM), an aberration-corrected atomic resolution scanning transmission electron microscope (STEM), and a focused ion beam (FIB) milling system.