Scanning Probe Microscopy Facility

Origin AFM

The Asylum Research MFP-3D Origin+ Atomic Force Microscope has a full range of imaging modes and accessories.

Asylum Research MFP-3D Origin+ AFM

Overview

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories.

A close up of the Origin AFM.

Capabilities

  • The Asylum Research MFP-3D Origin+ AFM features the same core performance as the MFP-3D Origin but includes support for the complete range of innovative MFP-3D accessories.
  • High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Modern flexured and sensored scanner design
  • Large sample stage
  • Numerous environmental accessories for temperature control
  • Controlled gas or liquid environment options that are simple, safe, and effective
  • Unique accessories for applying external forces to a wide range of samples

SOP

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.

General purpose tapping mode cantilevers are available for $21 each. Users will be charged for a new training cantilever. Afterwards, users can purchase any other type of cantilever themselves. Contact staff for a vendor list.

Vendor

Oxford Instruments Asylum Research offers brochures and webinars related to the Origin AFM.

Showing sample preparation for the Origin AFM.

Training

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

Some of these courses offer advanced study of surfaces.

MSE 5665 - Surface and Interface Science for Chemical and Materials Analysis

Coursework and hands-on laboratory experiences explore physical and chemical properties governing surface processes and the appropriate analysis techniques used to study interfaces and surface chemical reactions. Topics include principles of physical chemistry and materials science for understanding and applying modern surface analysis.

  • Credits: 3.0
  • Lec-Rec-Lab: (2-0-2)
  • Semesters Offered: On Demand
  • Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore