The Applied Chemical and Morphological Analysis Laboratory (ACMAL), managed by the Department of Materials Science and Engineering, is a University Shared Facility and member of the Michigan Tech Materials Characterization and Fabrication Facilities. Lab research activities include characterizing materials and studying the chemistry of materials at the atomic level. ACMAL houses an extensive array of electron microanalytical and x-ray instruments. Five discrete facilities featuring state-of-the-art equipment comprise the ACMAL:
- The Electron Optics Facility (EOF) includes two scanning electron microscopes (SEM), an atomic resolution scanning transmission electron microscope (S-TEM), and a focused ion beam milling system (FIB).
- The X-Ray Facility offers an energy-dispersive x-ray fluorescence spectrometer and five x-ray diffractometers.
- The Scanning Probe Microscopy Facility offers scanning tunneling microscopy (STM) and an atomic force microscope (AFM).
- The Surface Analysis Facility offers a scanning Auger microprobe for Auger electron spectroscopy (AES).
- The Fluorescence Optical Microscopy Facility offers two optical microscopes and digital cameras.
|Auger Spectrometer||M&M 615|
|Atomic Force Microscope||M&M 616|
|X-Ray Diffraction||M&M 629|
|X-Ray Fluorescence||M&M 630|
|Image Analysis||M&M 631|
|Focused Ion Beam System||M&M 632|
|Field Emission Scanning Electron Microscope||M&M 636|
|Electron Microscope Sample Preparation||M&M 637|
|Environmental Scanning Electron Microscope||M&M 717|
ACMAL Rooms Contact: Owen Mills
|Labs and Equipment||Location||Contact|
|Varied Sample Preparation Techniques||M&M 637||Owen Mills|
|Optical Microscopy and Metallography||M&M U107||Daniel Seguin|
|Image Analysis and Processing||M&M 631||Owen Mills|
|Powder Characterization||M&M 532||Paul Fraley|
|Encapsulation/Glass Working Station||Paul Fraley|
|Xenon Lamp||Paul Fraley|
|LECO Light Element Chemical Analyses||M&M U109||Daniel Seguin|
|X-Ray Diffraction||M&M 629||Edward Laitila|