Structural and Chemical Characterization


The Applied Chemical and Morphological Analysis Laboratory (ACMAL), managed by the Department of Materials Science and Engineering, is a University Core Facility and member of the Michigan Tech Materials Characterization & Fabrication Facilities. Lab research activities include characterizing materials and studying the chemistry of materials at the atomic level. ACMAL houses an extensive array of electron microanalytical and x-ray instruments. Five discrete facilities featuring state-of-the-art equipment comprise the ACMAL:

  • The Electron Optics Facility offers two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM), and a focused ion beam milling system (FIB).
  • The X-Ray Facility offers an energy-dispersive x-ray fluorescence spectrometer and five x-ray diffractometers.
  • The Scanning Probe Microscopy Facility offers scanning tunneling microscopy (STM) and an atomic force microscope (AFM).
  • The Surface Analysis Facility offers a scanning Auger microprobe for Auger electron spectroscopy (AES).
  • The Fluorescence Optical Microscopy Facility offers two optical microscopes and digital cameras.
ACMAL Rooms Location
Auger Spectrometer M&M 615
Atomic Force Microscope M&M 616
Ultramicrotome M&M 617
X-Ray Diffraction M&M 629
X-Ray Fluorescence M&M 630
Image Analysis M&M 631
Focused Ion Beam System M&M 632
High Resolution Transmission Electron Microscope M&M 633
Scanning Electron Microscope M&M 635
Field Emission Scanning Electron Microscope M&M 636
Electron Microscope Sample Preparation M&M 637
Environmental Scanning Electron Microscope M&M 717

ACMAL Rooms Contact: Owen Mills

Labs and Equipment Location Contact
Varied Sample Preparation Techniques M&M 637 Owen Mills
Optical Microscopy and Metallography M&M U107 Daniel Seguin
Image Analysis and Processing M&M 631 Owen Mills
Powder Characterization M&M 532 Paul Fraley
Encapsulation/Glass Working Station Paul Fraley
Xenon Lamp Paul Fraley
LECO Light Element Chemical Analyses M&M U109 Daniel Seguin
X-Ray Diffraction M&M 629 Edward Laitila