Structural and Chemical Characterization
ACMAL
The Applied Chemical and Morphological Analysis Laboratory (ACMAL), managed by the Department of Materials Science and Engineering, is a University Core Facility and member of the Michigan Tech Materials Characterization & Fabrication Facilities. Lab research activities include characterizing materials and studying the chemistry of materials at the atomic level. ACMAL houses an extensive array of electron microanalytical and x-ray instruments. Five discrete facilities featuring state-of-the-art equipment comprise the ACMAL:
- The Electron Optics Facility offers two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM), and a focused ion beam milling system (FIB).
- The X-Ray Facility offers an energy-dispersive x-ray fluorescence spectrometer and five x-ray diffractometers.
- The Scanning Probe Microscopy Facility offers scanning tunneling microscopy (STM) and an atomic force microscope (AFM).
- The Surface Analysis Facility offers a scanning Auger microprobe for Auger electron spectroscopy (AES).
- The Fluorescence Optical Microscopy Facility offers two optical microscopes and digital cameras.
| ACMAL Rooms | Location |
|---|---|
| Auger Spectrometer | M&M 615 |
| Atomic Force Microscope | M&M 616 |
| Ultramicrotome | M&M 617 |
| X-Ray Diffraction | M&M 629 |
| X-Ray Fluorescence | M&M 630 |
| Image Analysis | M&M 631 |
| Focused Ion Beam System | M&M 632 |
| High Resolution Transmission Electron Microscope | M&M 633 |
| Scanning Electron Microscope | M&M 635 |
| Field Emission Scanning Electron Microscope | M&M 636 |
| Electron Microscope Sample Preparation | M&M 637 |
| Environmental Scanning Electron Microscope | M&M 717 |
ACMAL Rooms Contact: Owen Mills
| Labs and Equipment | Location | Contact |
|---|---|---|
| Varied Sample Preparation Techniques | M&M 637 | Owen Mills |
| Optical Microscopy and Metallography | M&M U107 | Daniel Seguin |
| Image Analysis and Processing | M&M 631 | Owen Mills |
| Powder Characterization | M&M 532 | Paul Fraley |
| Encapsulation/Glass Working Station | Paul Fraley | |
| Xenon Lamp | Paul Fraley | |
| LECO Light Element Chemical Analyses | M&M U109 | Daniel Seguin |
| X-Ray Diffraction | M&M 629 | Edward Laitila |