X-Ray Diffraction

Siemens D500 Powder Diffractometer


The Siemens D500 powder diffractometer is configured with an graphite monochrometer and IBM compatible workstation. This system is primarily used to satisfy the needs of undergraduate research and is housed in the undergraduate wing of the M&M building.

A close up of the XRD D500 instrument.


This theta-theta configured goniometer permits automated collection of intensity vs. scattering angle scans. Data reduction schemes include unit cell determination, pattern indexing, precision lattice parameter determination. Crystalline compounds can be identified through indexing with the built-in JCPDS powder diffraction database.