The Scintag XDS2000 powder diffractometer is configured with a graphite monochromoter and IBM compatible workstation running Scintag DMSNT software in Windows NT environment.
This theta-theta configured goniometer permits automated collection of intensity vs. scattering angle scans. Data reduction schemes include unit cell determination, pattern indexing, precision lattice parameter determination, and Reitveld analysis. Crystalline compounds can be identified through indexing with the built-in JCPDS powder diffraction database.
MSE 5130 - Crystallography & Diffraction
Crystallographic concepts and diffraction analyses in materials science.
- Credits: 3.0
- Lec-Rec-Lab: (2-0-3)
- Semesters Offered: On Demand
- Restrictions: Must be enrolled in one of the following Level(s): Graduate