Origin AFM
The Asylum Research MFP-3D Origin+ Atomic Force Microscope has a full range of imaging modes and accessories.
Overview
The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories.
Capabilities
- The Asylum Research MFP-3D Origin+ AFM features the same core performance as the MFP-3D Origin but includes support for the complete range of innovative MFP-3D accessories.
- High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional)
- Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
- Modern flexured and sensored scanner design
- Large sample stage
- Numerous environmental accessories for temperature control
- Controlled gas or liquid environment options that are simple, safe, and effective
- Unique accessories for applying external forces to a wide range of samples
SOP
Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.
General purpose tapping mode cantilevers are available for $21 each. Users will be charged for a new training cantilever. Afterwards, users can purchase any other type of cantilever themselves. Contact staff for a vendor list.
Vendor
Oxford Instruments Asylum Research offers brochures and webinars related to the Origin AFM.
Training
eTraining
Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.
Courses
Michigan Tech offers many undergraduate and graduate courses related to materials characterization.
Some of these courses offer advanced study of surfaces.