Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension
3000 operates in both tapping and contact modes, with capabilities of topographic
and phase imaging, lateral force microscopy, magnetic force microscopy, and adhesion
force mapping. It is also used in measurements of surface and adhesion forces.
The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety
of sample sizes and types. It can function in air or liquid, making it useful for
biological studies. The sample is placed on a stage which moves in the x, y, and z
directions via piezoelectric elements. A cantilever with a microscopic tip moves like
a spring over the surface of the sample. A laser beam reflected off the end of the
cantilever is recorded on photodiodes, producing an image of the surface topography.
Cantilevers vary in size from 3-100 µm with tip radii of 10-30 nm. The size of the
tip and flexibility of the cantilever contribute to the high resolution of the image,
which can reach 10 pm. The operating modes of the AFM (contact, non-contact, and tapping)
and lateral force microscopy allow the user to access a variety of functions of the
microscope. In addition to imaging, the AFM can measure the strength of inter-atomic
forces and can sense the presence of individual surface atoms.
Cantilevers are located in a box in the AFM lab. There is a log sheet next to them.
Facility users must record their use of tips.
Free online eTraining is available for this instrument. This self-paced tutorial and
reference content does not replace course requirements for authorized usage.