Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope
II operates in contact mode and is primarily used for high-resolution imaging and
surface force measurements in both gas and liquid environments.
Cantilevers are located in a box in the AFM lab. There is a log sheet next to them.
Facility users must record their use of tips.
Free online eTraining is available for this instrument. This self-paced tutorial and
reference content does not replace course requirements for authorized usage.