Scanning Probe Microscopy Facility

Veeco Nano

The Veeco Nanoscope II operates in contact mode of atomic force microscopy.

Veeco Nanoscope II AFM

Overview

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in both gas and liquid environments.

Close up of the Veeco Nano instrument.

Capabilities

SOP

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them. Facility users must record their use of tips.

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument: