Instrument Details
The Cross Section Polisher is a tabletop instrument that uses a broad ion beam to mill a high-quality, artifact-free cross-section of a sample for detailed imaging and microanalysis. This process is used to prepare difficult samples like those made of brittle, soft, or composite materials, and can include features for fine milling or temperature-sensitive materials
Capabilities
Argon ion milling to prepare cross-section polished samples
Vendor
JEOL