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Electron Optics Facility
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  • Hitachi FB-2000A FIB
  • FIB Operating Procedure
  • FIB Unloading
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  • Instrumentation
    • FEI 200kV Titan Themis STEM
    • Hitachi FB-2000A FIB
      • Basic Science
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      • Operating Procedure
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    • Hitachi S-4700 FE-SEM
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FIB Unloading

Hitachi FB-2000A FIB Training Index

  1. Basic Science
    1. Form and Function: Part 1 - Operation
    2. Form and Function: Part 2 - Applications
  2. Internal Components
  3. Safety Procedures
  4. Specimen Preparation
    1. Holder Types
    2. Preparation Options
  5. Operating Procedure
    1. Preliminary
    2. Start Up
    3. Specimen Exchange
    4. Alignment
    5. Lift Out Technique
    6. Deposition for Lift Out Technique
    7. Rough Milling for Lift Out Technique
    8. Landing the Probe for Lift Out Technique Part 1
    9. Landing the Probe for Lift Out Technique Part 2
    10. Fine Milling for Lift Out Technique
    11. Tungsten Deposition
    12. Bitmap Image Milling (SEM/TEM)
    13. Using the NPGS Software
    14. Unloading
    15. Shut Down
  6. Imaging Techniques
    1. FIB (Hitachi) Mode
    2. NPGS Mode
  7. FAQs
  8. Troubleshooting

  1. Close the S.C. AIRLOCK VALVE.
  2. Remove the HOLDER by pulling it straight out till it stops, then turn it a few degrees clockwise to the stop, then pull it straight out to the stop, then turn it counter-clockwise to the stop, then RELEASE THE HOLDER. Press the AIR button. Wait until you see the SEM SEC open and then gently pull the HOLDER free from the goniometer.
  3. Replace the PLUG.

Operating Procedure: Shut Down

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ACMAL: Applied Chemical and Morphological Analysis Laboratory

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1400 Townsend Drive
Houghton, Michigan 49931-1295
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