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Electron Optics Facility
  • ACMAL
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  • Hitachi FB-2000A FIB
  • FIB Imaging Techniques
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  • Instrumentation
    • FEI 200kV Titan Themis STEM
    • Hitachi FB-2000A FIB
      • Basic Science
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      • Operating Procedure
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    • Hitachi S-4700 FE-SEM
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FIB Imaging Techniques

Hitachi FB-2000A FIB Training Index

  1. Basic Science
    1. Form and Function: Part 1 - Operation
    2. Form and Function: Part 2 - Applications
  2. Internal Components
  3. Safety Procedures
  4. Specimen Preparation
    1. Holder Types
    2. Preparation Options
  5. Operating Procedure
    1. Preliminary
    2. Start Up
    3. Specimen Exchange
    4. Alignment
    5. Lift Out Technique
    6. Deposition for Lift Out Technique
    7. Rough Milling for Lift Out Technique
    8. Landing the Probe for Lift Out Technique Part 1
    9. Landing the Probe for Lift Out Technique Part 2
    10. Fine Milling for Lift Out Technique
    11. Tungsten Deposition
    12. Bitmap Image Milling (SEM/TEM)
    13. Using the NPGS Software
    14. Unloading
    15. Shut Down
  6. Imaging Techniques
    1. FIB (Hitachi) Mode
    2. NPGS Mode
  7. FAQs
  8. Troubleshooting

  • FIB (Hitachi) Mode
  • NPGS Mode

Imaging Techniques: FIB (Hitachi) Mode

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