Hitachi FB-2000A FIB Training Index
- Basic Science
- Internal Components
- Safety Procedures
- Specimen Preparation
- Holder Types
- Preparation Options
- Operating Procedures
- Preliminary
- Start Up
- Specimen Exchange
- Alignment
- Lift Out Technique
- Deposition for Lift Out Technique
- Rough Milling for Lift Out Technique
- Landing the Probe for Lift Out Technique Part 1
- Landing the Probe for Lift Out Technique Part 2
- Fine Milling for Lift Out Technique
- Tungsten Deposition
- Bitmap Image Milling (SEM/TEM)
- Using the NPGS Software
- Unloading
- Shut Down
- Imaging Techniques
- FIB (Hitachi) Mode
- NPGS Mode
- FAQs
- Troubleshooting