Surface Analysis Facility

XPS

The PHI 5800 XPS probes sample surfaces.

PHI 5800 X-ray Photoelectron Spectrometer

Overview

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including elemental mapping capabilities, an electron gun source for AES analysis, an ion sputter gun for depth profiling, and stage tilting for angle-resolved XPS.

The XPS was generously donated by the Army Research Laboratories with help from the Department of Chemistry at Michigan Tech.

A view of the XPS set up.

A research micrograph from the XPS.

Training

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

Some of these courses offer advanced study of surfaces.

MSE 5665 - Surface and Interface Science for Chemical and Materials Analysis

Coursework and hands-on laboratory experiences explore physical and chemical properties governing surface processes and the appropriate analysis techniques used to study interfaces and surface chemical reactions. Topics include principles of physical chemistry and materials science for understanding and applying modern surface analysis.

  • Credits: 3.0
  • Lec-Rec-Lab: (2-0-3)
  • Semesters Offered: On Demand
  • Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore