Structural and Chemical Characterization


The Applied Chemical and Morphological Analysis Laboratory (ACMAL), managed by the Department of Materials Science and Engineering, is a University Core Facility and member of the Michigan Tech Materials Characterization & Fabrication Facilities. Lab research activities include characterizing materials and studying the chemistry of materials at the atomic level. ACMAL houses an extensive array of electron microanalytical and x-ray instruments. Five discrete facilities featuring state-of-the-art equipment comprise the ACMAL:

  • The Electron Optics Facility offers two scanning electron microscopes (SEM), a high-resolution transmission electron microscope (TEM), and a focused ion beam milling system (FIB).
  • The X-Ray Facility offers an energy-dispersive x-ray fluorescence spectrometer and five x-ray diffractometers.
  • The Scanning Probe Microscopy Facility offers scanning tunneling microscopy (STM) and an atomic force microscope (AFM).
  • The Surface Analysis Facility offers a scanning Auger microprobe for Auger electron spectroscopy (AES).
  • The Fluorescence Optical Microscopy Facility offers two optical microscopes and digital cameras.
ACMAL RoomsLocation
Auger SpectrometerM&M 615
Atomic Force MicroscopeM&M 616
UltramicrotomeM&M 617
X-Ray DiffractionM&M 629
X-Ray FluorescenceM&M 630
Image AnalysisM&M 631
Focused Ion Beam SystemM&M 632
High Resolution Transmission Electron MicroscopeM&M 633
Scanning Electron MicroscopeM&M 635
Field Emission Scanning Electron MicroscopeM&M 636
Electron Microscope Sample PreparationM&M 637
Environmental Scanning Electron MicroscopeM&M 717

ACMAL Rooms Contact: Owen Mills

Labs and EquipmentLocationContact
Varied Sample Preparation TechniquesM&M 637Owen Mills
Optical Microscopy and MetallographyM&M U107Daniel Seguin
Image Analysis and ProcessingM&M 631Owen Mills
Powder CharacterizationM&M 532Paul Fraley
LECO Light Element Chemical AnalysesM&M U109Daniel Seguin
X-Ray DiffractionM&M 629Edward Laitila