Location
Minerals and Materials Engineering Building (M&M) 431
Contact
906-487-2058
Access Type
Description
The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.
Minerals and Materials Engineering Building (M&M) 431
906-487-2058
The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.