Location
Minerals and Materials Engineering Building (M&M) 431
Contact
Ryan Bischer
989-225-2141
Access Type
Description
The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.
Minerals and Materials Engineering Building (M&M) 431
Ryan Bischer
989-225-2141
The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.