Instrument Details
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips XL 40 ESEM is also capable of imaging hydrated and contaminated samples. Advanced accessories include a thin-window energy dispersive spectrometer (EDS) and hot or cold stages. The system is operated via easy-to-use software control using a Windows user interface. The ESEM can be used for organic and inorganic scanning electron analysis.
Capabilities
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Secondary electron detector
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Backscattered electron detector
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Oxford UltiMax 175 Large-angle X-ray Energy Dispersive Spectrometer (EDS)
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Oxford HKL Electron Backscattered Diffraction (EBSD) detector
Vendor
Philips