Hitachi S-4700 FE-SEM | Applied Chemical and Morphological Analysis Laboratory

Close up the primary instrumentation for the FE-SEM.

Location

Minerals and Materials Engineering Building 636

Contact

Erico Freitas

Access Type

FOM

Training Module

Start

Instrument Details

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on exceptionally clean specimens. It is also suitable for polymeric materials. The S-4700 is configured to detect secondary and backscattered electrons as well as characteristic X-rays. The system is fully automated and is operated via easy-to-use menu driven software.

Capabilities

Accelerating Voltages from 1–30 kV
Everhar-Thornley secondary electron detector
Retractable Robinson backscattered electron detector
Through-the-lens secondary electron detector

Vendor

4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging Systems. (NOTE: 4pi has ceased manufacturing and sales. ACMAL is confident that this will not affect 4pi’s ability to provide technical support to this lab.)

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Courses

MSE 4530 - Scanning Electron Microscopy and X-ray Microanalysis

Topics include electron beam and image formation, beam- specimen interactions, and x-ray microanalysis. Course content is relevant to students of the physical sciences, engineering, and related disciplines. Includes a laboratory experience that provides hands-on practical training sufficient to enable independent use of the SEM.

Credits: 3.0
Lec-Rec-Lab: (2-0-3)
Semesters Offered: Spring
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore

BL 4035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with emphasis on sample preparation. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: Must be enrolled in one of the following Class(es): Junior, Senior

BL 5035 - Bioimaging

Current concepts in light and electron microscopy and scanning probe techniques. Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and video microscopy as applied to biological specimens with an emphasis on sample preparation. Emphasis will be placed on application of advanced techniques. Half semester course.

Credits: 2.0
Lec-Rec-Lab: (0-4-0)
Semesters Offered: Fall, in even years
Restrictions: May not be enrolled in one of the following Class(es): Freshman, Sophomore, Junior

BL 4100 - Special Topics in Biological Sciences

A study of recent developments in the biological sciences.

Credits: variable to 10.0; Repeatable to a Max of 10
Semesters Offered: Fall, Spring, Summer
Restrictions: Permission of instructor required

BL 5340 - Special Topics in Biology

A discussion of recent developments in the biological sciences. Recent offerings have included population genetics, taxonomy of aquatic insects, herpetology, bryology, fungi, and lichens.

Credits: variable to 10.0; Repeatable to a Max of 10
Semesters Offered: Fall, Spring, Summer
Restrictions: Permission of instructor required; Must be enrolled in one of the following Level(s): Graduate