X-Ray Facility
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About X-Ray Diffraction

X-ray powder diffraction (XRD) is a powerful structural characterization tool that is essentially a two point probe which measures the distance between all pairs of atoms within the diffraction volume. As a result, the information gained is dependent only on your creative knowledge of diffraction and ability to mathematically extract the information from the data. There are several well established XRD analysis techniques provided with the instrument analysis and data acquisition software; in addition, the facility has developed several in-house software programs along with a variety of stand-alone XRD related software programs. With over 20 years of experience in teaching, training, data acquisition, and data analysis, in the field of XRD on a wide variety of samples, including unconventional diffraction samples, please consult with Edward Laitila to learn more on how this facility may enhance your research.

XRD Capabilities

  • Development of Customized Data Collection and Analysis
  • Phase Analysis
  • Lattice Parameter Determination
  • Percent Crystallinity
  • Quantitative Analysis
  • Crystallite (Particle) Size and Strain Analysis
  • Residual Stress
  • Texture
  • Laue Photographs
  • A Variety of Other Techniques Available Upon Request

Ancillary Equipment

  • Zero Background Sample Holder
  • Custom Powder Sample Holders
  • Custom Irregular Shaped Solid Holder
  • Custom Liquid Holder
  • ICDD-JCPDS database
  • Anton-Paar High Temperature Stage