Electrical Characterization

Minerals and Materials Engineering Building (M&M) 424


Electrical Device Characterization

A probe station is available for connecting to electrical devices with contact pads that are > 300 x 300 µm2. There are four micromanipulators for making contact to samples. The probe station is also equipped with a microscope and a fiber light. For measuring the device parameters there is a Keithley 4200-SCS Parameter Analyzer with preprogrammed recipes for typical electrical devices, such as diodes or MOSFETS. Additionally, an HP 4284A Precision LCR Meter is available for capacitance voltage measurements or other alternative usages.

Electrical Device Characterization
 Electrical Device Characterization
Electrical Device Characterization, closer view
 Electrical Device Characterization

Wire Bonder

A K&S gold wire bonder is available for making connections between sample contact pads (300 × 300 µm2) and external connection pads.

Wire Bonder
 Wire Bonder

Four Point Measurement System

A four point measurement system is available for determining the sheet resistance of doped layers or for thin films to determine their resistivity.

Four Point Measurement System
 Four Point Measurement System