Electrical Characterization

Minerals and Materials Engineering Building (M&M) 424


Electrical Device Characterization

A probe station is available for connecting to electrical devices with contact pads down to 50 µm × 50 µm. There are four micromanipulators for making contact to samples. The probe station is also equipped with a microscope and a fiber light. For measuring the device parameters there is a Keithley 4200A-SCS Parameter Analyzer with preprogrammed recipes for typical electrical devices, such as diodes or MOSFETS. The Keithley 4200A-SCS has:

  • (4) Source measure unit Modules
  • (1) 4210-CVU Capacitance-Voltage Module
  • 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips
Electrical Device Characterization equipment
 Electrical Device Characterization
Electrical Device Characterization, closer view
 Electrical Device Characterization

Wire Bonder

A K&S gold wire bonder is available for making connections between sample contact pads (300 × 300 µm2) and external connection pads.

Wire Bonder equipment
 Wire Bonder

Four Point Measurement System

A four point measurement system is available for determining the sheet resistance of doped layers or for thin films to determine their resistivity.

Four Point Measurement System equipment
 Four Point Measurement System