Electron Optics Facility

TEM

The JEOL JEM-2010 TEM is a high resolution transmission electron microscope.

JEOL JEM-2010 TEM

Overview

The JEOL JEM-2010 is a high resolution transmission electron microscope that can be operated between 80 and 200 kV accelerating voltage. The JEM-2010 is configured with a high brightness LaB6 source for convergent and nano beam electron diffraction. The instrument is configured with several useful accessories, including a Gatan Orius SC200 high-speed digital camera and an Oxford energy dispersive spectrometer/4pi workstation. Together, these systems permit advanced microstructural and compositional studies of a wide variety of organic and inorganic materials.

A view of the TEM setup.

A TEM research micrograph.

Training

eTraining

Free online eTraining is available for this instrument. This self-paced tutorial and reference content does not replace course requirements for authorized usage.

Available topics related to this instrument:

Courses

Michigan Tech offers many undergraduate and graduate courses related to materials characterization.

One of these courses offers direct, hands-on training in transmission electron microscopy.

MSE 5550 - Transmission Electron Microscopy

Practical aspects of materials characterization by transmission electron microscopy.

  • Credits: 3.0
  • Lec-Rec-Lab: (2-0-3)
  • Semesters Offered: On Demand
  • Restrictions: Must be enrolled in one of the following Level(s): Graduate