The JEOL JEM-2010 is a high resolution transmission electron microscope that can be
operated between 80 and 200 kV accelerating voltage. The JEM-2010 is configured with
a high brightness LaB6 source for convergent and nano beam electron diffraction. The instrument is configured
with several useful accessories, including a Gatan Orius SC200 high-speed digital
camera and an Oxford energy dispersive spectrometer/4pi workstation. Together, these
systems permit advanced microstructural and compositional studies of a wide variety
of organic and inorganic materials.
Free online eTraining is available for this instrument. This self-paced tutorial and
reference content does not replace course requirements for authorized usage.